Optical monitoring of silver-based transparent heat mirrors

Cheng Chung Lee; Shang Hui Chen; Cheng Chung Jaing

doi:10.1364/AO.35.005698

Optical monitoring of silver-based transparent heat mirrors

Cheng Chung Lee, Shang Hui Chen, Cheng Chung Jaing

Department of Optics and Photonics

Research output: Contribution to journal › Article › peer-review

63 Scopus citations

Abstract

Both three-layer (TiO₂–Ag–TiO₂) and five-layer (TiO₂–Ag–TiO₂–Ag–TiO₂) heat mirrors with optimum transmission in the visible and good reflectance in the IR have been designed by admittance diagram techniques. The mirrors were fabricated successfully by optical monitoring. An interesting anomalous layer was found and explained, and its equivalent refractive index and thickness are 2.015 — i0.016 and 2.56 nm, respectively.

Original language	English
Pages (from-to)	5698-5703
Number of pages	6
Journal	Applied Optics
Volume	35
Issue number	28
DOIs	https://doi.org/10.1364/AO.35.005698
State	Published - 1 Oct 1996

Keywords

Admittance diagram
Anomalous layer
Ion-assisted deposition
Optical monitoring
Transparent heat mirror

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AB - Both three-layer (TiO2–Ag–TiO2) and five-layer (TiO2–Ag–TiO2–Ag–TiO2) heat mirrors with optimum transmission in the visible and good reflectance in the IR have been designed by admittance diagram techniques. The mirrors were fabricated successfully by optical monitoring. An interesting anomalous layer was found and explained, and its equivalent refractive index and thickness are 2.015 — i0.016 and 2.56 nm, respectively.

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KW - Anomalous layer

KW - Ion-assisted deposition

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Optical monitoring of silver-based transparent heat mirrors

Abstract

Keywords

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