Optical monitoring of silver-based transparent heat mirrors

Cheng Chung Lee, Shang Hui Chen, Cheng Chung Jaing

Research output: Contribution to journalArticlepeer-review

63 Scopus citations


Both three-layer (TiO2–Ag–TiO2) and five-layer (TiO2–Ag–TiO2–Ag–TiO2) heat mirrors with optimum transmission in the visible and good reflectance in the IR have been designed by admittance diagram techniques. The mirrors were fabricated successfully by optical monitoring. An interesting anomalous layer was found and explained, and its equivalent refractive index and thickness are 2.015 — i0.016 and 2.56 nm, respectively.

Original languageEnglish
Pages (from-to)5698-5703
Number of pages6
JournalApplied Optics
Issue number28
StatePublished - 1 Oct 1996


  • Admittance diagram
  • Anomalous layer
  • Ion-assisted deposition
  • Optical monitoring
  • Transparent heat mirror


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