Optical constants of electrochromic films and contrast ratio of reflective electrochromic devices

Cheng Chung Jaing, Chien Jen Tang, Chih Chao Chan, Kun Hsien Lee, Chien Cheng Kuo, Hsi Chao Chen, Cheng Chung Lee

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

This study investigates the optical constants of WO3electrochromic films and NiO ion-storage films in bleached and colored states and that of a Ta2O5film used as an ion conductor. These thin films were all prepared by electron-beam evaporation and characterized using a spectroscopic ellipsometer. The spectra obtained using a spectrophotometer and those calculated from the optical constants agreed closely. An all-solid thin-film reflective electrochromic device was fabricated and discussed. Its mean contrast ratio of reflectance in the range of 400-700 nm was 37.91.

Original languageEnglish
Pages (from-to)A154-A158
JournalApplied Optics
Issue number4
DOIs
StatePublished - 1 Feb 2014

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