Abstract
This study investigates the optical constants of WO3electrochromic films and NiO ion-storage films in bleached and colored states and that of a Ta2O5film used as an ion conductor. These thin films were all prepared by electron-beam evaporation and characterized using a spectroscopic ellipsometer. The spectra obtained using a spectrophotometer and those calculated from the optical constants agreed closely. An all-solid thin-film reflective electrochromic device was fabricated and discussed. Its mean contrast ratio of reflectance in the range of 400-700 nm was 37.91.
Original language | English |
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Pages (from-to) | A154-A158 |
Journal | Applied Optics |
Issue number | 4 |
DOIs | |
State | Published - 1 Feb 2014 |