Optical analysis of haze ratio and antireflection in structured thin film solar cell

C. C. Chao, Y. C. Pan, C. M. Wang, J. Y. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, the influence of the haze ratio and antireflection properties of the thin film solar cell with a periodic texture is theoretical investigated. Two different cases, Case 1and Case 2, are compared. Case 1 shows an extremely high haze ratio of 97.4% while Case 2 shows a low reflectance of 0.3%. For the thickness of the a-Si:H layer is 100nm~400nm, the JSC of the antireflection case is higher than that of high haze ratio one. Until the thickness of the a-Si:H layer is increased to 500nm, the JSC of Case 1 is 20.5 mA/cm2 which is higher than Case 2.

Original languageEnglish
Title of host publicationInternational Conference on Applications of Electromagnetism and Student Innovation Competition Awards, AEM2C 2010
Pages56-60
Number of pages5
DOIs
StatePublished - 2010
EventInternational Conference on Applications of Electromagnetism and Student Innovation Competition Awards, AEM2C 2010 - Taipei, Taiwan
Duration: 11 Aug 201013 Aug 2010

Publication series

NameInternational Conference on Applications of Electromagnetism and Student Innovation Competition Awards, AEM2C 2010

Conference

ConferenceInternational Conference on Applications of Electromagnetism and Student Innovation Competition Awards, AEM2C 2010
Country/TerritoryTaiwan
CityTaipei
Period11/08/1013/08/10

Fingerprint

Dive into the research topics of 'Optical analysis of haze ratio and antireflection in structured thin film solar cell'. Together they form a unique fingerprint.

Cite this