On-wafer single contact quadrature accuracy measurement using receiver mode in four-port vector network analyzer

Yin Cheng Chang, Yuan Chia Hsu, Shuw Guann Lin, Ying Zong Juang, Hwann Kaeo Chiou

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

This paper presents the calibration procedure using a five-port calibration kit based on receiver mode in vector network analyzer (VNA). After de-embedding the phase/amplitude errors from cal-kit, the quadrature phase accuracy and amplitude error of a quadrature voltage controlled oscillator (QVCO) can be directly obtained using on-wafer testing with a single contact. A 5 GHz QVCO was tested to demonstrate the feasibility of measurement. The I/Q mismatch on both phase and amplitude of the QVCO were precisely measured. Only single probe contact is required during the measurement that minimizes the uncertainty.

Original languageEnglish
Title of host publication2008 IEEE MTT-S International Microwave Symposium Digest, MTT
Pages371-374
Number of pages4
DOIs
StatePublished - 2008
Event2008 IEEE MTT-S International Microwave Symposium Digest, MTT - Atlanta, GA, United States
Duration: 15 Jun 200820 Jun 2008

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Conference

Conference2008 IEEE MTT-S International Microwave Symposium Digest, MTT
Country/TerritoryUnited States
CityAtlanta, GA
Period15/06/0820/06/08

Keywords

  • Amplitude error
  • Phase calibration
  • Phase error
  • Quadrature accuracy
  • QVCO

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