On-wafer noise figure measurements of millimeter-wave LNA and mixer

Yin Cheng Chang, Shuw Guann Lin, Hwann Kaeo Chiou, Da Chiang Chang, Ying Zong Juang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

An on-wafer measurement technique is performed to characterize the noise figure (NF) at millimeter-wave (MMW) band. Two NF-measurement techniques are reviewed, and the Y-factor method is discussed in detail. The measurement principles and considerations are proposed for the device under test (DUT) at MMW band. The test procedure and setups are performed to measure the V-band amplifier and mixer. The experimental results confirm the validity with high accuracy by comparing with the simulations.

Original languageEnglish
Title of host publication2010 Asia-Pacific Microwave Conference Proceedings, APMC 2010
Pages1424-1427
Number of pages4
StatePublished - 2010
Event2010 Asia-Pacific Microwave Conference, APMC 2010 - Yokohama, Japan
Duration: 7 Dec 201010 Dec 2010

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC

Conference

Conference2010 Asia-Pacific Microwave Conference, APMC 2010
Country/TerritoryJapan
CityYokohama
Period7/12/1010/12/10

Keywords

  • low noise amplifiers
  • millimeter wave measurements
  • mixers
  • noise figure

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