On-wafer mm-wave V-band semi-automatic power measurement system

Hsu Feng Hsiao, Shuw Guann Lin, Hwann Kaeo Chiou, Da Chiang Chang, Ying Zong Juang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

This paper proposes an on-wafer mm-wave V-band semi-automatic power measurement system (OMVSPMS) with some external passive attenuators (ATT) for mm-wave circuits and presents the calibration and measurement method programmed by standard commands for programmable instruments (SCPI) language with Agilent VEE software. Since accurate measurement results are desirable, for example, the 1-dB compression point (P1dB) and the input third order intercept point (IP3) are items of linearity for mm-wave active circuits. Both also need right power into device under test (DUT) to expect right P1dB and IP3. Therefore, an implementation of calibration and measurement method combined traditional mm-wave instruments with some external passive attenuators is used for accurate power generation of the stimulus and accurate power reception of the receiver.

Original languageEnglish
Title of host publication2010 Asia-Pacific Microwave Conference Proceedings, APMC 2010
Pages1432-1435
Number of pages4
StatePublished - 2010
Event2010 Asia-Pacific Microwave Conference, APMC 2010 - Yokohama, Japan
Duration: 7 Dec 201010 Dec 2010

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC

Conference

Conference2010 Asia-Pacific Microwave Conference, APMC 2010
Country/TerritoryJapan
CityYokohama
Period7/12/1010/12/10

Keywords

  • automatic
  • measurement
  • On-wafer
  • power
  • V-band

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