Novel concept of hardware security in using gate-switching FinFET nonvolatile memory to implement true-random-number generator

W. Y. Yang, B. Y. Chen, C. C. Chuang, E. R. Hsieh, K. S. Li, Steve S. Chung

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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