Nonalloying surface reconstructions of ultrathin Sn films on Cu(111) investigated with LEED, XPS, and photoelectron extended fine structure analysis

Xihui Liang, Jun Hao Deng, Liang Jen Fan, Yaw Wen Yang, Dah An Luh

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

By preventing surface alloying during growth of Sn on Cu(111) at 100 K, we discovered two novel nonalloying surface reconstructions, denoted as lower-coverage (LC) and higher-coverage (HC) phases. They were investigated with low energy electron diffraction (LEED), x-ray photoemission spectroscopy (XPS), and analysis of photoelectron extended fine structure (PEFS). The LC phase has a p(2×2) structure with one Sn atom per unit cell, corresponding to a Sn coverage 0.25 ML; the HC phase has a structure of M=(2113) (matrix notation) with two Sn atoms per unit cell, corresponding to a Sn coverage 0.40 ML. Structural models for the two phases are proposed.

Original languageEnglish
Article number075406
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume84
Issue number7
DOIs
StatePublished - 2 Aug 2011

Fingerprint

Dive into the research topics of 'Nonalloying surface reconstructions of ultrathin Sn films on Cu(111) investigated with LEED, XPS, and photoelectron extended fine structure analysis'. Together they form a unique fingerprint.

Cite this