Multiple-fault diagnosis using faulty-region identification

Meng Jai Tasi, Mango C.T. Chao, Jing Yang Jou, Meng Chen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations


The fault diagnosis has become an increasing portion of today's IC-design cycle and significantly determines product's time-to-market. However, the failure behaviors from the defective chips may not be fully represented by the single fault model. In this paper, we propose a fault-diagnosis framework targeting multiple stuck-at faults. This framework first reports a minimal suspect region, in which all real faults are topologically covered. Next, a proposed ranking method is applied to sieve out the real faults from the candidates within the suspect region. The experimental results show that the proposed diagnosis framework can effectively locate the multiple stuck-at faults within a neighborhood, which may generate erroneous signals cancelling one another and are difficult to be diagnosed based on a single-fault-model method.

Original languageEnglish
Title of host publicationProceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009
Number of pages6
StatePublished - 2009
Event2009 27th IEEE VLSI Test Symposium, VTS 2009 - Santa Cruz, CA, United States
Duration: 3 May 20097 May 2009

Publication series

NameProceedings of the IEEE VLSI Test Symposium


Conference2009 27th IEEE VLSI Test Symposium, VTS 2009
Country/TerritoryUnited States
CitySanta Cruz, CA


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