@inproceedings{b7b3a80d5c094632b2e00c195581e768,
title = "Modeling and testing comparison faults of TCAMs with asymmetric cells",
abstract = "Ternary content addressable memory (TCAM) is a key component in various applications for its fast lookup operation. Symmetric and asymmetric TCAM cells are two widely used cells for implementing a TCAM array. This paper presents several comparison fault models of TCAMs with asymmetric cells based on electrical defects. Some new comparison faults which do not exist in a TCAM with symmetric cells are found. A march-like test algorithm is also proposed to cover the defined comparison faults. The test algorithm consists of 8N Write operations and (3N + 2B) Compare operations for an N × B-bit TCAM with Hit output only.",
author = "Hu, {Yong Jyun} and Huang, {Yu Jen} and Li, {Jin Fu}",
year = "2009",
doi = "10.1109/VTS.2009.18",
language = "???core.languages.en_GB???",
isbn = "9780769535982",
series = "Proceedings of the IEEE VLSI Test Symposium",
pages = "15--20",
booktitle = "Proceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009",
note = "2009 27th IEEE VLSI Test Symposium, VTS 2009 ; Conference date: 03-05-2009 Through 07-05-2009",
}