Modeling and testing comparison faults of memristive ternary content addressable memories

Li Wei Deng, Jin Fu Li, Yong Xiao Chen

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Finished

2 results

Finished
Testing and Reliability-Enhancement Techniques for Stacked Memories(2/3)
Li, J.
1/08/17 → 31/07/18
Project: Research
Testing of Emerging Nonvolatile-Based Memories for Iot(2/3)
Li, J.
1/08/17 → 31/07/18
Project: Research