Modeling and testing comparison faults of memristive ternary content addressable memories

Li Wei Deng, Jin Fu Li, Yong Xiao Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Ternary content addressable memory (TCAM) is widely used for the network applications. However, TCAM is a power-and area-consuming component. Memristor-based TCAM is considered as a good alternative for reducing the required power and area. In this paper, we define comparison faults of 5T2R memristor-based TCAMs. Electrical defects such as transistor stuck-open/stuck-on, resistive open, short, and bridge are comprehensively injected and simulated by Hspice. We also propose a March-like test March-MCAM to fully cover the defined comparison faults. March-MCAM requires 6N Write operations and (14N + 2B) Compare operations for an N × B-bit mrTCAM.

Original languageEnglish
Title of host publicationProceedings - 2018 23rd IEEE European Test Symposium, ETS 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-6
Number of pages6
ISBN (Electronic)9781538637289
DOIs
StatePublished - 29 Jun 2018
Event23rd IEEE European Test Symposium, ETS 2018 - Bremen, Germany
Duration: 28 May 20181 Jun 2018

Publication series

NameProceedings of the European Test Workshop
Volume2018-May
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780

Conference

Conference23rd IEEE European Test Symposium, ETS 2018
Country/TerritoryGermany
CityBremen
Period28/05/181/06/18

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