Modeling and Testing comparison faults for ternary content addressable memories

Jin Fu Li, Chou Kun Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations


This paper presents the comparison faults of TCAMs based on physical defects, such as shorts between two circuit nodes and transistor stuck-open and stuck-on faults. Accordingly, several comparison fault models are proposed. A March-like test algorithm for comparison faults is also proposed. The test algorithm only requires 4N Write operations, 3N Erase operations, and (4N+2B) Compare operations to cover 100% comparison faults for an N×B-bit TCAM. Compared with the previous work, the proposed test algorithm has lower time complexity for TCAMs with wide words and the time complexity is independent of the number of stuck-on faults. Also, the algorithm can cover all defects that cause a failed Compare operation. Moreover, it can be realized by built-in self-test circuitry with lower area cost.

Original languageEnglish
Title of host publicationProceedings - 23rd IEEE VLSI Test Symposium, VTS 2005
Number of pages6
StatePublished - 2005
Event23rd IEEE VLSI Test Symposium, VTS 2005 - Palm Springs, CA, United States
Duration: 1 May 20055 May 2005

Publication series

NameProceedings of the IEEE VLSI Test Symposium


Conference23rd IEEE VLSI Test Symposium, VTS 2005
Country/TerritoryUnited States
CityPalm Springs, CA


Dive into the research topics of 'Modeling and Testing comparison faults for ternary content addressable memories'. Together they form a unique fingerprint.

Cite this