TY - JOUR
T1 - Modeling and integration of planning, scheduling, and equipment configuration in semiconductor manufacturing part II. FAB capability assessment
AU - Fordyce, Ken
AU - Milne, R. John
AU - Wang, Chi Tai
AU - Zisgen, Horst
N1 - Publisher Copyright:
© 2015 International journal of industrial engineering.
PY - 2015
Y1 - 2015
N2 - Managing the supply chain of a semiconductor based package goods enterprise-including planning, scheduling, dispatching, and equipment configurations-is a complicated undertaking, particularly in a manner that is responsive to changes throughout the demand supply network. In a companion paper (Part I. Review of Successes and Opportunities), we illustrate the need for industrial engineering teams to serve as agents of change, review prior successes, and highlight issues and opportunities for improvement in this highly integrated decision space. In this Part II paper, we identify modeling challenges and opportunities within a critical component of responsiveness: semiconductor fabrication facility/factory (FAB) capability assessment. This involves estimating the output of the FAB given the current conditions of the FAB (work in process, planned wafer starts, equipment availability and configuration, and other factors). A twin objective of FCA is to determine the actions the FAB should take (how to change the current conditions) to achieve specified output targets.
AB - Managing the supply chain of a semiconductor based package goods enterprise-including planning, scheduling, dispatching, and equipment configurations-is a complicated undertaking, particularly in a manner that is responsive to changes throughout the demand supply network. In a companion paper (Part I. Review of Successes and Opportunities), we illustrate the need for industrial engineering teams to serve as agents of change, review prior successes, and highlight issues and opportunities for improvement in this highly integrated decision space. In this Part II paper, we identify modeling challenges and opportunities within a critical component of responsiveness: semiconductor fabrication facility/factory (FAB) capability assessment. This involves estimating the output of the FAB given the current conditions of the FAB (work in process, planned wafer starts, equipment availability and configuration, and other factors). A twin objective of FCA is to determine the actions the FAB should take (how to change the current conditions) to achieve specified output targets.
KW - Hierarchical production control
KW - Semiconductor manufacturing
KW - Systems integration
KW - Tool capacity planning
KW - Waiting time
UR - http://www.scopus.com/inward/record.url?scp=84964057127&partnerID=8YFLogxK
M3 - 期刊論文
AN - SCOPUS:84964057127
SN - 1072-4761
VL - 22
SP - 601
EP - 607
JO - International Journal of Industrial Engineering : Theory Applications and Practice
JF - International Journal of Industrial Engineering : Theory Applications and Practice
IS - 5
ER -