Mesoporous silica powders and films-Pore size characterization by krypton adsorption

Chien Yang Chiu; Anthony S.T. Chiang; Kuei Jung Chao

doi:10.1016/j.micromeso.2005.12.003

Mesoporous silica powders and films-Pore size characterization by krypton adsorption

Chien Yang Chiu, Anthony S.T. Chiang, Kuei Jung Chao

Department of Chemical and Materials Engineering

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

An experimental correlation was established between pore size derived from N₂ adsorption, DN2, and capillary condensation/evaporation pressure, (P/P₀)_t,Kr, obtained from Kr adsorption/desorption isotherms on powdery siliceous MCM-41, MCM-48 and SBA-15 samples, and was analyzed by the DBdB theory. The correlation was then used to estimate the pore size distribution from the Kr adsorption isotherm of mesoporous silica layers on Si(1 0 0) wafer prepared using P123 and Brij^®56 surfactants. It was found by TEM analysis that the pore shape in the thin films was distorted from circular to ellipsoidal, leading to different pore sizes estimated from the adsorption and desorption branches of the Kr isotherm.

Original language	English
Pages (from-to)	244-253
Number of pages	10
Journal	Microporous and Mesoporous Materials
Volume	91
Issue number	1-3
DOIs	https://doi.org/10.1016/j.micromeso.2005.12.003
State	Published - 15 Apr 2006

Keywords

Kr adsorption
Mesoporous silica
Thin film

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10.1016/j.micromeso.2005.12.003

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title = "Mesoporous silica powders and films-Pore size characterization by krypton adsorption",

abstract = "An experimental correlation was established between pore size derived from N2 adsorption, DN2, and capillary condensation/evaporation pressure, (P/P0)t,Kr, obtained from Kr adsorption/desorption isotherms on powdery siliceous MCM-41, MCM-48 and SBA-15 samples, and was analyzed by the DBdB theory. The correlation was then used to estimate the pore size distribution from the Kr adsorption isotherm of mesoporous silica layers on Si(1 0 0) wafer prepared using P123 and Brij{\textregistered}56 surfactants. It was found by TEM analysis that the pore shape in the thin films was distorted from circular to ellipsoidal, leading to different pore sizes estimated from the adsorption and desorption branches of the Kr isotherm.",

keywords = "Kr adsorption, Mesoporous silica, Thin film",

author = "Chiu, {Chien Yang} and Chiang, {Anthony S.T.} and Chao, {Kuei Jung}",

note = "Funding Information: The authors are indebted to National Science Council, Taiwan, for financial supports through contract NSC 93-2113-M-007-025, and Ms. Kuo-Ying Huang for sample preparation. ",

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doi = "10.1016/j.micromeso.2005.12.003",

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T1 - Mesoporous silica powders and films-Pore size characterization by krypton adsorption

AU - Chiu, Chien Yang

AU - Chiang, Anthony S.T.

AU - Chao, Kuei Jung

N1 - Funding Information: The authors are indebted to National Science Council, Taiwan, for financial supports through contract NSC 93-2113-M-007-025, and Ms. Kuo-Ying Huang for sample preparation.

PY - 2006/4/15

Y1 - 2006/4/15

N2 - An experimental correlation was established between pore size derived from N2 adsorption, DN2, and capillary condensation/evaporation pressure, (P/P0)t,Kr, obtained from Kr adsorption/desorption isotherms on powdery siliceous MCM-41, MCM-48 and SBA-15 samples, and was analyzed by the DBdB theory. The correlation was then used to estimate the pore size distribution from the Kr adsorption isotherm of mesoporous silica layers on Si(1 0 0) wafer prepared using P123 and Brij®56 surfactants. It was found by TEM analysis that the pore shape in the thin films was distorted from circular to ellipsoidal, leading to different pore sizes estimated from the adsorption and desorption branches of the Kr isotherm.

AB - An experimental correlation was established between pore size derived from N2 adsorption, DN2, and capillary condensation/evaporation pressure, (P/P0)t,Kr, obtained from Kr adsorption/desorption isotherms on powdery siliceous MCM-41, MCM-48 and SBA-15 samples, and was analyzed by the DBdB theory. The correlation was then used to estimate the pore size distribution from the Kr adsorption isotherm of mesoporous silica layers on Si(1 0 0) wafer prepared using P123 and Brij®56 surfactants. It was found by TEM analysis that the pore shape in the thin films was distorted from circular to ellipsoidal, leading to different pore sizes estimated from the adsorption and desorption branches of the Kr isotherm.

KW - Kr adsorption

KW - Mesoporous silica

KW - Thin film

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U2 - 10.1016/j.micromeso.2005.12.003

DO - 10.1016/j.micromeso.2005.12.003

M3 - 期刊論文

AN - SCOPUS:33645076532

SN - 1387-1811

VL - 91

SP - 244

EP - 253

JO - Microporous and Mesoporous Materials

JF - Microporous and Mesoporous Materials

IS - 1-3

ER -

Mesoporous silica powders and films-Pore size characterization by krypton adsorption

Abstract

Keywords

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