In this paper we present a data compression technique that can be used to speed up the transmission of diagnosis data from the embedded RAM with built-in self-diagnosis (BISD) support. The proposed approach compresses the faulty-cell address and March syndrome to about 28% of the original size under the March-17N diagnostic test algorithm. The key component of the compressor is a novel syndrome-accumulation circuit, which can be realized by a content-addressable memory. Experimental results show that the area overhead is about 0.9% for a 1Mb SRAM with 164 faults. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage capacity requirement.
|Number of pages||5|
|Journal||Proceedings -Design, Automation and Test in Europe, DATE|
|State||Published - 2001|
|Event||Design, Automation and Test in Europe Conference and Exhibition 2001, DATE 2001 - Munich, Germany|
Duration: 13 Mar 2001 → 16 Mar 2001