Memory fault diagnosis by syndrome compression

Jin Fu Li, Cheng Wen Wu

Research output: Contribution to journalConference articlepeer-review

29 Scopus citations


In this paper we present a data compression technique that can be used to speed up the transmission of diagnosis data from the embedded RAM with built-in self-diagnosis (BISD) support. The proposed approach compresses the faulty-cell address and March syndrome to about 28% of the original size under the March-17N diagnostic test algorithm. The key component of the compressor is a novel syndrome-accumulation circuit, which can be realized by a content-addressable memory. Experimental results show that the area overhead is about 0.9% for a 1Mb SRAM with 164 faults. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage capacity requirement.

Original languageEnglish
Article number915007
Pages (from-to)97-101
Number of pages5
JournalProceedings -Design, Automation and Test in Europe, DATE
StatePublished - 2001
EventDesign, Automation and Test in Europe Conference and Exhibition 2001, DATE 2001 - Munich, Germany
Duration: 13 Mar 200116 Mar 2001


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