Measurements of nanometer surface structure by incoherent confocal laser-feedback

Kung Li Deng, Chun Hung Lu, Jyhpyng Wang, Po Hsiu Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An optical scanning microscope is developed using the confocal laser feedback technique on a superluminescent laser diode with bias current detection capable of measuring surface structure with 20 nm depth resolution and micrometers dynamic range. This paper describes the measurement techniques of nanometer surface structure using incoherent confocal laser feedback.

Original languageEnglish
Title of host publicationConference Proceedings - Lasers and Electro-Optics Society Annual Meeting
PublisherPubl by IEEE
ISBN (Print)0780319710
StatePublished - 1994
EventProceedings of the Conference on Lasers and Electro-Optics - Anaheim, CA, USA
Duration: 8 May 199413 May 1994

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting
Volume8

Conference

ConferenceProceedings of the Conference on Lasers and Electro-Optics
CityAnaheim, CA, USA
Period8/05/9413/05/94

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