Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry

Ju Yi Lee; Hsueh Ching Shih; Cyun Tai Hong; Teng Ko Chou

doi:10.1016/j.optcom.2007.04.021

Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry

Ju Yi Lee, Hsueh Ching Shih, Cyun Tai Hong, Teng Ko Chou

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

44 Scopus citations

Abstract

The phase difference change between the s and p polarization lights in surface plasmon resonance sensing systems is strongly influenced by the refractive index of the test sample. In this paper, the phase difference change, measured by common-path phase quadrature interferometry, can be used to estimate the refractive index change. In the experimental results we obtain a phase stability of 0.07°, and a resolving power for the refractive index of 6 × 10^-6 RIU. This method has the advantages of a simple optical setup, being easier to operate in real time, and low cost. In addition, due to the common-path arrangement, our method can also eliminate the surrounding noise.

Original language	English
Pages (from-to)	283-287
Number of pages	5
Journal	Optics Communications
Volume	276
Issue number	2
DOIs	https://doi.org/10.1016/j.optcom.2007.04.021
State	Published - 15 Aug 2007

Keywords

Phase quadrature interferometry
Refractive index
Surface plasmon resonance

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10.1016/j.optcom.2007.04.021

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title = "Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry",

abstract = "The phase difference change between the s and p polarization lights in surface plasmon resonance sensing systems is strongly influenced by the refractive index of the test sample. In this paper, the phase difference change, measured by common-path phase quadrature interferometry, can be used to estimate the refractive index change. In the experimental results we obtain a phase stability of 0.07°, and a resolving power for the refractive index of 6 × 10-6 RIU. This method has the advantages of a simple optical setup, being easier to operate in real time, and low cost. In addition, due to the common-path arrangement, our method can also eliminate the surrounding noise.",

keywords = "Phase quadrature interferometry, Refractive index, Surface plasmon resonance",

author = "Lee, {Ju Yi} and Shih, {Hsueh Ching} and Hong, {Cyun Tai} and Chou, {Teng Ko}",

note = "Funding Information: This study was supported by the National Science Council, Taiwan, under Contract No. NSC 95-2221-E-008-091. The authors are also grateful to the Industrial Technology Research Institute (ITRI) of Taiwan for providing the experimental equipment and research help. ",

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T1 - Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry

AU - Lee, Ju Yi

AU - Shih, Hsueh Ching

AU - Hong, Cyun Tai

AU - Chou, Teng Ko

N1 - Funding Information: This study was supported by the National Science Council, Taiwan, under Contract No. NSC 95-2221-E-008-091. The authors are also grateful to the Industrial Technology Research Institute (ITRI) of Taiwan for providing the experimental equipment and research help.

PY - 2007/8/15

Y1 - 2007/8/15

N2 - The phase difference change between the s and p polarization lights in surface plasmon resonance sensing systems is strongly influenced by the refractive index of the test sample. In this paper, the phase difference change, measured by common-path phase quadrature interferometry, can be used to estimate the refractive index change. In the experimental results we obtain a phase stability of 0.07°, and a resolving power for the refractive index of 6 × 10-6 RIU. This method has the advantages of a simple optical setup, being easier to operate in real time, and low cost. In addition, due to the common-path arrangement, our method can also eliminate the surrounding noise.

AB - The phase difference change between the s and p polarization lights in surface plasmon resonance sensing systems is strongly influenced by the refractive index of the test sample. In this paper, the phase difference change, measured by common-path phase quadrature interferometry, can be used to estimate the refractive index change. In the experimental results we obtain a phase stability of 0.07°, and a resolving power for the refractive index of 6 × 10-6 RIU. This method has the advantages of a simple optical setup, being easier to operate in real time, and low cost. In addition, due to the common-path arrangement, our method can also eliminate the surrounding noise.

KW - Phase quadrature interferometry

KW - Refractive index

KW - Surface plasmon resonance

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DO - 10.1016/j.optcom.2007.04.021

M3 - 期刊論文

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VL - 276

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JO - Optics Communications

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ER -

Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry

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Keywords

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