@inproceedings{43ab37b0dc1e4f5fac8a15f8033b12b8,
title = "Measurement module based on a common-path Fabry-P{\'e}rot interferometer for determining three-degree-of-freedom motion parameters",
abstract = "In this investigation, a novel three-degree-of-freedom laser interferometer is proposed which enables to determine the motion parameters including linear displacement, horizontal and vertical straightness in a linear axis. The modified common-path Fabry-P{\'e}rot interferometer consists of two optical arrangements for measuring the linear displacement and the straightness respectively. In the optical arrangement of the linear displacement measurement, the one eighth waveplate in the Fabry-P{\'e}rot optical cavity constructed with a planar mirror and a corner cube retro-reflector (CCR) is employed to form the orthogonal phase shift between interferometric signals and then they can be acquired by two photodiodes (PDs) to detect the linear displacement. In the other optical arrangement, a quadrant photodetector (QD) serves to inspect the lateral displacements induced by the dynamic offset of CCR. Furthermore, the relevant measuring characteristics of the self-developed laser interferometer are compact optical arrangement, convenient operation and efficient inspection. It would be beneficial for the linear positioning measurement and calibration of precision machines, e.g., linear positioning stages or high precision machine tools.",
keywords = "Linear displacement, Linear stage, Straightness, Three-degree-of-freedom",
author = "Shih, {Hung Ta} and Tung, {Pi Cheng} and Wang, {Yung Cheng} and Shyu, {Lih Horng} and Chang, {Chung Ping} and Eberhard Manske and Lee, {Bean Yin} and Lin, {Jui Cheng}",
note = "Publisher Copyright: {\textcopyright} 2018 CURRAN-CONFERENCE. All rights reserved.; 18th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2018 ; Conference date: 04-06-2018 Through 08-06-2018",
year = "2018",
language = "???core.languages.en_GB???",
isbn = "9780995775121",
series = "European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition, EUSPEN 2018",
publisher = "euspen",
pages = "115--116",
editor = "O. Riemer and Enrico Savio and D. Billington and Leach, {R. K.} and D. Phillips",
booktitle = "European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition, EUSPEN 2018",
}