Marking oxide films on the section of Al-XSi alloys by ultrasonic-vibration treatment

Yeong Jern Chen, Li Wu Huang, Teng Shih Shih

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Oxide films entrapped in Al-XSi alloys with an X from 0% to 13% are different, and can be identified by the presented ultrasonic-vibration treatment. After polishing and ultrasonic-vibration treatment, the surfaces or castings then show differently shaped foggy marks, including lumps, flakes, strips or spots. Oxide films fracture and particles become detached from the film during ultrasonic-vibration treatment. The polished surface thus becomes partly eroded after treatment, and these eroded areas are visibly as differently shaped foggy marks. This paper presents a sequential summary of the formation of these eroded areas, foggy marks, in samples of pure aluminum and Al-XSi alloys during ultrasonic-vibration treatment.

Original languageEnglish
Pages (from-to)1190-1197
Number of pages8
JournalMaterials Transactions
Volume44
Issue number6
DOIs
StatePublished - Jun 2003

Keywords

  • Aluminum
  • Cavitation
  • Micro-jet
  • Oxide film
  • Shock waves
  • Ultrasonic

Fingerprint

Dive into the research topics of 'Marking oxide films on the section of Al-XSi alloys by ultrasonic-vibration treatment'. Together they form a unique fingerprint.

Cite this