Low resistivity and low compensation ratio Ga-doped ZnO films grown by plasma-assisted molecular beam epitaxy

Cheng Yu Chen, Li Han Hsiao, Jen Inn Chyi

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

In this study, Ga-doped ZnO (GZO) thin films were deposited on GaN templates by using plasma-assisted molecular beam epitaxy. To obtain low resistivity GZO films, in-situ post-annealing under Zn overpressure was carried out to avoid the generation of acceptor-liked Zn vacancies. The resultant films showed optical transparency over 95% in the visible spectral range. By reducing the acceptor-like defects, GZO films with compensation ratio near 0.4 and resistivity simultaneously lower than 1×10-4 Ω cm have been successfully demonstrated.

Original languageEnglish
Pages (from-to)216-220
Number of pages5
JournalJournal of Crystal Growth
Volume425
DOIs
StatePublished - 28 Jul 2015

Keywords

  • A1. Doping
  • A3. Molecular beam epitaxy
  • B1. Oxides
  • B2. Semiconducting II-VI materials

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