Lissajous scan trajectory with internal model principle controller for fast AFM image scanning

Keyphrases

• Controller 100%
• Atomic Force Microscopy Image 100%
• Scanning Speed 100%
• Scanning Accuracy 100%
• Scanning Trajectory 100%
• Internal Model Principle 100%
• Image Scanning 100%
• Lissajous Scanning 100%
• Measuring Instrument 50%
• Non-conductive Material 50%
• Atomic Force Microscopy 50%
• Neural Network 50%
• Principles-based 50%
• Dynamic Characteristics 50%
• Measurement Instrument 50%
• Complementary Sliding Mode Control 50%
• Raster Scanning 50%
• Mechanical Resonance 50%
• Micro-nano 50%
• Nanoscale Measurement 50%
• Lissajous Trajectory 50%

Engineering

• Atomic Force Microscopy 100%
• Internals 100%
• Scan Speed 100%
• Nanoscale 50%
• Conductive 50%
• Sliding Mode Control 50%
• Scale Measurement 50%

Computer Science

• Internal Model 100%
• Neural Network 50%
• Sliding Mode Control 50%
• Measurement Tool 50%