Light extraction enhancement of InGaN MQW by reducing total internal reflection through surface plasmon effect

Chien Chieh Lee, D. L. Wang, C. C. Chen, Jenq Yang Chang, B. J. Pong, Gou Chung Chi, Liang Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Coupling of a InGaN/GaN multi-quantum well (MQW) and semitransparent metal layer is shown to result in dramatic enhancement of spontaneous emission rate by the surface plasmon effect in the optical spectral range. A five-pairs 18.5nm InGaN/GaN MQW is positioned 175nm, form various thickness (t=5∼50nm) silver layer. And periodic patterns (p=0.25∼0.8μm) are defined in the top semitransparent metal layer by e-beam lithography, which are grating structures can be incorporated into the metal film to excite surface plasmon between the interference of the metal film and semiconductor. We have experimentally measured photoluminescence intensity and peak position of spontaneous emission of the fabricated structures and compared with the unprocessed samples, whilst still ensuring that most of the emission takes place into the surface plasmon (SP) mode. And the implication of these results for extracting light by reducing total internal reflection (TIR) from light emission diode is discussed.

Original languageEnglish
Title of host publicationSixth International Conference on Solid State Lighting
DOIs
StatePublished - 2006
EventSixth International Conference on Solid State Lighting - San Diego, CA, United States
Duration: 14 Aug 200617 Aug 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6337
ISSN (Print)0277-786X

Conference

ConferenceSixth International Conference on Solid State Lighting
Country/TerritoryUnited States
CitySan Diego, CA
Period14/08/0617/08/06

Keywords

  • Light emission diode
  • Light extraction
  • Surface plasmon
  • Total internal reflection

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