LCD mura detection based on accumulated differences and multi-resolution background subtraction

You Ching Lee, Cheng En Shie, Din Chang Tseng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

A mura detection approach based on the difference accumulation and background estimation is proposed to detect mura in the thin film transistor liquid crystal display (TFT-LCD) images. We were motivated by wavelet transform to derive a multi-resolution method for accelerating the detecting speed of background estimation. While the visibility of mura depends on inspecting angles and online environmental light luminance, sometimes the defects may be invisible in the observed images. Thus, we calibrate the non-uniform luminance and accumulate the continuous online images for depressing noise and enhancing the contrast between mura and background. However, the online moving speed is unstable; thus, we propose a full-automatic non-uniform displacement calibration method. We demonstrate them by applying to real and artificial online image sequences. The efficiency and effect is described in experiments. Our methods are also compared with other mura detecting methods.

Original languageEnglish
Title of host publicationProceedings of the 5th International Conference on Image and Graphics, ICIG 2009
PublisherIEEE Computer Society
Pages189-194
Number of pages6
ISBN (Print)9780769538839
DOIs
StatePublished - 2009
Event5th International Conference on Image and Graphics, ICIG 2009 - Xi'an, Shanxi, China
Duration: 20 Sep 200923 Sep 2009

Publication series

NameProceedings of the 5th International Conference on Image and Graphics, ICIG 2009

Conference

Conference5th International Conference on Image and Graphics, ICIG 2009
Country/TerritoryChina
CityXi'an, Shanxi
Period20/09/0923/09/09

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