Lateral schottky GaN rectifiers formed by Si+ ion implantation

Y. Irokawa, Jihyun Kim, F. Ren, K. H. Baik, B. P. Gila, C. R. Abernathy, S. J. Pearton, C. C. Pan, G. T. Chen, J. I. Chyi

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'Lateral schottky GaN rectifiers formed by Si+ ion implantation'. Together they form a unique fingerprint.

Keyphrases

Material Science