Large Electron-Phonon Coupling at an Interface

D. A. Luh, T. Miller, J. J. Paggel, T. C. Chiang

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The strength of electron-phonon coupling in atomically uniform films of Ag on Fe is determined by angle-resolved photoemission from quantum well states in these films over a wide temperature range. As the film thickness is reduced, contributions from the surface and interface should become more important, and, experimentally, a large enhancement with superimposed quantum oscillations is observed. An analysis of the quantum oscillations indicates that this large enhancement is an interface effect.

Original languageEnglish
Pages (from-to)4
Number of pages1
JournalPhysical Review Letters
Volume88
Issue number25
DOIs
StatePublished - 2002

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