TY - GEN
T1 - Invited Paper
T2 - 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023
AU - Sato, Takashi
AU - Wang, Chun Yao
AU - Chen, Yu Guang
AU - Huang, Tsung Wei
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - The 'CAD Contest at ICCAD' is a challenging, multi-month, research and development competition, focusing on advanced, real-world problems in the field of electronic design automation (EDA). Since 2012, the contest has been publishing many sophisticated circuit design problems, from system-level design to physical design, together with industrial benchmarks and solution evaluators. Contestants can participate in one or more problems provided by EDA/IC industry. The winners will be awarded at an ICCAD special session dedicated to this contest. Every year, the contest attracts more than a hundred teams, fosters productive industry-academia collaborations, and leads to hundreds of publications in top-tier conferences and journals. The 2023 CAD Contest has 210 teams from all over the world, which generates the highest participation record. Moreover, the problems of this year cover state-of-the-art EDA research trends such as circuit verification, hardware security, 3D-IC, and Machine Learning (ML) for EDA from well-known EDA/IC companies. We believe the contest keeps enhancing impact and boosting EDA researches.
AB - The 'CAD Contest at ICCAD' is a challenging, multi-month, research and development competition, focusing on advanced, real-world problems in the field of electronic design automation (EDA). Since 2012, the contest has been publishing many sophisticated circuit design problems, from system-level design to physical design, together with industrial benchmarks and solution evaluators. Contestants can participate in one or more problems provided by EDA/IC industry. The winners will be awarded at an ICCAD special session dedicated to this contest. Every year, the contest attracts more than a hundred teams, fosters productive industry-academia collaborations, and leads to hundreds of publications in top-tier conferences and journals. The 2023 CAD Contest has 210 teams from all over the world, which generates the highest participation record. Moreover, the problems of this year cover state-of-the-art EDA research trends such as circuit verification, hardware security, 3D-IC, and Machine Learning (ML) for EDA from well-known EDA/IC companies. We believe the contest keeps enhancing impact and boosting EDA researches.
KW - 3D-IC
KW - CAD Contest
KW - ML for EDA
KW - circuit verification
KW - computer-aided design
KW - electronic design automation
KW - hardware security
UR - http://www.scopus.com/inward/record.url?scp=85181401115&partnerID=8YFLogxK
U2 - 10.1109/ICCAD57390.2023.10323648
DO - 10.1109/ICCAD57390.2023.10323648
M3 - 會議論文篇章
AN - SCOPUS:85181401115
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
BT - 2023 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 28 October 2023 through 2 November 2023
ER -