Investigating useful and distinguishing features around the eyelash region

Yung Hui Li, Marios Savvides, Tsuhan Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

13 Scopus citations

Abstract

Traditionally, iris recognition is always about analyzing and extracting features from iris texture. We proposed to investigate regions around eyelashes and extract useful information which helps us to perform ethnic classification. We propose an algorithm which is easy to implement and effective. First, we locate eyelash region by using ASM to model eyelid boundary. Second, we extract local patch around local landmarks. After image processing, we are able to separate eyelashes and extract features from the directions of eyelashes. Those features are descriptive and can be used to train classifiers. Experimental results show our method can successfully perform East-Asian/Caucasian classification up to 93% accuracy, which shows our proposed method is useful and promising.

Original languageEnglish
Title of host publication2008 37th IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2008
DOIs
StatePublished - 2008
Event2008 37th IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2008 - Washington, DC, United States
Duration: 15 Oct 200817 Oct 2008

Publication series

NameProceedings - Applied Imagery Pattern Recognition Workshop
ISSN (Print)1550-5219

Conference

Conference2008 37th IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2008
Country/TerritoryUnited States
CityWashington, DC
Period15/10/0817/10/08

Keywords

  • ASM
  • Ethnic classification
  • Eyelash analysis
  • Soft biometrics

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