Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling

An Chi Wei; Jyh Rou Sze

Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling

Graduate Institute of Energy Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

Rigorous coupled wave analysis and Monte Carlo ray tracing techniques are combined together for modeling the optical performance of OLED. The simulated and the measured results have shown agreement with each other.

Original language	English
Article number	JTu5A.7
Journal	Optics InfoBase Conference Papers
State	Published - 2015
Event	Optics and Photonics for Energy and the Environment, E2 2015 - Suzhou, China Duration: 2 Nov 2015 → 5 Nov 2015

提升白光OLED性能之創新元件設計與製程技術研發(2/3)
Ho, J.-R. (PI)
1/01/15 → 31/12/15
Project: Research

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abstract = "Rigorous coupled wave analysis and Monte Carlo ray tracing techniques are combined together for modeling the optical performance of OLED. The simulated and the measured results have shown agreement with each other.",

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T2 - Optics and Photonics for Energy and the Environment, E2 2015

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Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling

Abstract

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提升白光OLED性能之創新元件設計與製程技術研發(2/3)

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