Abstract
We demonstrate that the thickness increase of the porous layer on p-type (1-10 ohm-cm) silicon can be inhibited from hundreds to several nm/min in regular anodizing by exposure to He-Ne laser irradiation. During 2.0 mW laser irradiation, the growth in thickness was reduced to 5-6 nm/minute by anodizing with a current density of 10 mA/cm2. The inhibition effect on the thickness increase of porous silicon depends significantly on the laser power during a fixed anodizing time.
Original language | English |
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Pages (from-to) | H265-H268 |
Journal | Journal of the Electrochemical Society |
Volume | 163 |
Issue number | 5 |
DOIs | |
State | Published - 2016 |