TY - GEN
T1 - Improved vector compaction for power estimation with multi-sequence sampling technique
AU - Hsu, Chih Yang
AU - Liu, Chien Nan Jimmy
AU - Jou, Jing Yang
N1 - Publisher Copyright:
© 2003 IEEE.
PY - 2003
Y1 - 2003
N2 - A fast and accurate power estimation of circuits is definitely required when the low power issues become more and more important. For large circuits, vector compaction techniques could provide a fast solution for power estimation with reasonable accuracy. In previous work [11], we proposed an efficient vector compaction method with grouping and single-sequence consecutive sampling technique for CMOS circuits. The single-sequence approach improved the losses on compaction ratio and speedup by minimizing the useless transitions in traditional random or random-liked sampling approaches but it still involved some undesired transitions. In this paper, we propose a new consecutive sampling technique, multi-sequence approach. It can dramatically reduce the useless transitions without involving any undesired transitions. Compared to the random sampling and the single-sequence approaches, the experimental results demonstrate that the average compaction ratio and the average speedup can be significantly improved with our multi-sequence approach.
AB - A fast and accurate power estimation of circuits is definitely required when the low power issues become more and more important. For large circuits, vector compaction techniques could provide a fast solution for power estimation with reasonable accuracy. In previous work [11], we proposed an efficient vector compaction method with grouping and single-sequence consecutive sampling technique for CMOS circuits. The single-sequence approach improved the losses on compaction ratio and speedup by minimizing the useless transitions in traditional random or random-liked sampling approaches but it still involved some undesired transitions. In this paper, we propose a new consecutive sampling technique, multi-sequence approach. It can dramatically reduce the useless transitions without involving any undesired transitions. Compared to the random sampling and the single-sequence approaches, the experimental results demonstrate that the average compaction ratio and the average speedup can be significantly improved with our multi-sequence approach.
UR - http://www.scopus.com/inward/record.url?scp=84944676075&partnerID=8YFLogxK
U2 - 10.1109/VTSA.2003.1252581
DO - 10.1109/VTSA.2003.1252581
M3 - 會議論文篇章
AN - SCOPUS:84944676075
T3 - International Symposium on VLSI Technology, Systems, and Applications, Proceedings
SP - 176
EP - 179
BT - VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 20th International Symposium on VLSI Technology, Systems and Applications, VLSI 2003
Y2 - 6 October 2003 through 8 October 2003
ER -