Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation

W. Y. Chen; M. J. Chen; C. C. Cheng; T. M. Hsu; C. J. Wang; J. I. Chyi

doi:10.1063/1.3589372

Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation

W. Y. Chen, M. J. Chen, C. C. Cheng, T. M. Hsu, C. J. Wang, J. I. Chyi

Research output: Contribution to journal › Article › peer-review

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Abstract

Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nanosize oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.

Original language	English
Article number	191110
Journal	Applied Physics Letters
Volume	98
Issue number	19
DOIs	https://doi.org/10.1063/1.3589372
State	Published - 9 May 2011

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title = "Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation",

abstract = "Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nanosize oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.",

author = "Chen, {W. Y.} and Chen, {M. J.} and Cheng, {C. C.} and Hsu, {T. M.} and Wang, {C. J.} and Chyi, {J. I.}",

note = "Funding Information: The authors thank the National Science Council of the Republic of China, Taiwan, for financially supporting this research under Contract No. NSC 99-2119-M-008-018-MY3.",

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T1 - Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation

AU - Chen, W. Y.

AU - Chen, M. J.

AU - Cheng, C. C.

AU - Hsu, T. M.

AU - Wang, C. J.

AU - Chyi, J. I.

N1 - Funding Information: The authors thank the National Science Council of the Republic of China, Taiwan, for financially supporting this research under Contract No. NSC 99-2119-M-008-018-MY3.

PY - 2011/5/9

Y1 - 2011/5/9

N2 - Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nanosize oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.

AB - Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nanosize oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.

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DO - 10.1063/1.3589372

M3 - 期刊論文

AN - SCOPUS:79959684085

SN - 0003-6951

VL - 98

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 19

M1 - 191110

ER -

Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation

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