Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-Oxidation

W. Y. Chen, M. J. Chen, C. C. Cheng, C. J. Wang, J. I. Chyi, T. M. Hsu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nano-size oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2012
PagesJTh2A.97
StatePublished - 2012
EventCLEO: Applications and Technology, CLEO_AT 2012 - San Jose, CA, United States
Duration: 6 May 201211 May 2012

Publication series

NameCLEO: Applications and Technology, CLEO_AT 2012

Conference

ConferenceCLEO: Applications and Technology, CLEO_AT 2012
Country/TerritoryUnited States
CitySan Jose, CA
Period6/05/1211/05/12

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