IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

Katherine Shu Min Li; Yao Wen Chang; Chauchin Su; Chung Len Lee; Jwu E. Chen

doi:10.1145/1118299.1118391

IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

Katherine Shu Min Li, Yao Wen Chang, Chauchin Su, Chung Len Lee, Jwu E. Chen

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.

Original language	English
Title of host publication	Proceedings of the ASP-DAC 2006
Subtitle of host publication	Asia and South Pacific Design Automation Conference 2006
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	366-371
Number of pages	6
ISBN (Print)	0780394518, 9780780394513
DOIs	https://doi.org/10.1145/1118299.1118391
State	Published - 2006
Event	ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 - Yokohama, Japan Duration: 24 Jan 2006 → 27 Jan 2006

Publication series

Name	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume	2006

Conference

Conference	ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006
Country/Territory	Japan
City	Yokohama
Period	24/01/06 → 27/01/06

Access to Document

10.1145/1118299.1118391

Cite this

Li, K. S. M., Chang, Y. W., Su, C., Lee, C. L., & Chen, J. E. (2006). IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. In Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 (pp. 366-371). Article 1594710 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; Vol. 2006). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/1118299.1118391

Li, Katherine Shu Min ; Chang, Yao Wen ; Su, Chauchin et al. / IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006. Institute of Electrical and Electronics Engineers Inc., 2006. pp. 366-371 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

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title = "IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults",

abstract = "We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.",

author = "Li, {Katherine Shu Min} and Chang, {Yao Wen} and Chauchin Su and Lee, {Chung Len} and Chen, {Jwu E.}",

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doi = "10.1145/1118299.1118391",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

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booktitle = "Proceedings of the ASP-DAC 2006",

note = "ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 ; Conference date: 24-01-2006 Through 27-01-2006",

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Li, KSM, Chang, YW, Su, C, Lee, CL & Chen, JE 2006, IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. in Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006., 1594710, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, vol. 2006, Institute of Electrical and Electronics Engineers Inc., pp. 366-371, ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006, Yokohama, Japan, 24/01/06. https://doi.org/10.1145/1118299.1118391

IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. / Li, Katherine Shu Min; Chang, Yao Wen; Su, Chauchin et al.
Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006. Institute of Electrical and Electronics Engineers Inc., 2006. p. 366-371 1594710 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; Vol. 2006).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Chang, Yao Wen

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AU - Chen, Jwu E.

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AB - We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.

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PB - Institute of Electrical and Electronics Engineers Inc.

T2 - ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006

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Li KSM, Chang YW, Su C, Lee CL, Chen JE. IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. In Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006. Institute of Electrical and Electronics Engineers Inc. 2006. p. 366-371. 1594710. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). doi: 10.1145/1118299.1118391

IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

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