Identifying Untestable Faults in Sequential Circuits

Hsing Chung Liang, Chung Len Lee, Jwu E. Chen

Research output: Contribution to journalArticlepeer-review

26 Scopus citations
Original languageEnglish
Pages (from-to)14-23
Number of pages10
JournalIEEE Design and Test of Computers
Volume12
Issue number3
DOIs
StatePublished - 1995

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