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Identification of robust untestable path delay faults
Wen Ching Wu
, Chung Len Lee
, Jwu E. Chen
Department of Electrical Engineering
Research output
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peer-review
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Keyphrases
Path Delay Faults
100%
Distributed Processing
40%
Computation Time
20%
Benchmark Circuits
20%
Circuit Partitioning
20%
Test Path
20%
Untestable Faults
20%
Re-convergence
20%
Computer Science
Distributed Processing
100%
Experimental Result
50%
Computation Time
50%
Benchmark Circuit
50%