Identification of robust untestable path delay faults

Wen Ching Wu, Chung Len Lee, Jwu E. Chen

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

This paper presents a theoretical analysis to identify robust untestable path delay faults. It first classifies the path reconvergence of fanouts into seven cases and deduces the necessary conditions to robustly test path delay faults for each case. It then proposes a procedure, based on the deduced conditions, to identify the robust untestable path delay faults. The procedure was applied to ISCAS 85' circuits[1] and it was found that the robust untestable faults occupy a high percentage of the total path delay faults. In addition, it also presents a method to estimate the number of robust untestable path delay faults for a circuit.

Original languageEnglish
Pages (from-to)229-235
Number of pages7
JournalProceedings of the Asian Test Symposium
StatePublished - 1995
EventProceedings of the 1995 4th Asian Test Symposium - Bangalore, India
Duration: 23 Nov 199524 Nov 1995

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