How to cut out expired data with nearly zero overhead for solid-state drives

Wei Lin Wang, Tseng Yi Chen, Yuan Hao Chang, Hsin Wen Wei, Wei Kuan Shih

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Owing to flash memory constraints, a garbage collection (GC) mechanism hurts flash storage lifespan and performance since it generates a massive amount of write data to flash memory. To add insult to injury, all GC designs cannot identify disused data from valid data; therefore, all valid data, including disused data, will be rewritten to flash memory during the GC process. Fortunately, a flash storage vendor recently proposed a new write command to bring extra information to flash translation layer (FTL). Thanks to the new write command, the lifetime information of data can be brought from a host-side system to an FTL management layer for disused data identification. By such observations, this work proposes a dual-time referencing FTL (DTR-FTL) design to deal with disused data and minimize the overhead of GC by referring to data lifetime information and block retention time.

Original languageEnglish
Title of host publication2020 57th ACM/IEEE Design Automation Conference, DAC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781450367257
DOIs
StatePublished - Jul 2020
Event57th ACM/IEEE Design Automation Conference, DAC 2020 - Virtual, San Francisco, United States
Duration: 20 Jul 202024 Jul 2020

Publication series

NameProceedings - Design Automation Conference
Volume2020-July
ISSN (Print)0738-100X

Conference

Conference57th ACM/IEEE Design Automation Conference, DAC 2020
Country/TerritoryUnited States
CityVirtual, San Francisco
Period20/07/2024/07/20

Keywords

  • Flash memory
  • Multi-streamed write
  • Time-aware FTL

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