High reliability built-in self-detection and self-correction design for DCT/IDCT application

Chang Hsin Cheng, Chun Lung Hsu, Chung Kai Liu, Shih Yin Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposes an efficient built-in self-detection and self-correction techniques to detect and correct error in discrete cosine transform (DCT)/inverse discrete cosine transform (IDCT) based on the biresidue codes. On the other hand, any single bit error of DCT/IDCT can be efficiently detected or corrected. Experimental results show the proposed BISDC architecture has good performance in throughput with reasonable area overhead and high reliability.

Original languageEnglish
Title of host publicationProceedings - IEEE International SOC Conference, SOCC 2011
Pages213-218
Number of pages6
DOIs
StatePublished - 2011
Event24th IEEE International System on Chip Conference, SOCC 2011 - Taipei, Taiwan
Duration: 26 Sep 201128 Sep 2011

Publication series

NameInternational System on Chip Conference
ISSN (Print)2164-1676
ISSN (Electronic)2164-1706

Conference

Conference24th IEEE International System on Chip Conference, SOCC 2011
Country/TerritoryTaiwan
CityTaipei
Period26/09/1128/09/11

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