Hierarchical test integration methodology for 3-D ICs

Che Wei Chou, Jin Fu Li, Yun Chao Yu, Chih Yen Lo, Ding Ming Kwai, Yung Fa Chou

Research output: Contribution to journalComment/debate

4 Scopus citations
Original languageEnglish
Article number7096969
Pages (from-to)59-70
Number of pages12
JournalIEEE Design and Test
Volume32
Issue number4
DOIs
StatePublished - 1 Jul 2015

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