Heterodyne grating interferometry based on sinusoidal phase modulation for displacement measurement

Ju Yi Lee, Hung Lin Hsieh, Zhi Ying Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this study, a heterodyne grating interferometer based on the sinusoidal phase modulation method for displacement measurements was proposed. The interference beams were modulated using a sinusoidal oscillating grating, and the proposed frequency-domain quadrature detection method was used to detect the optical phase of the interferometer and determine the displacement. Experimental results were consistent with the strain gauge results for several displacement ranges. When only high-frequency noise was considered, our method achieved a measurement resolution of approximately 2 nm.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection X
EditorsPeter Lehmann, Armando Albertazzi Goncalves, Wolfgang Osten
PublisherSPIE
ISBN (Electronic)9781510611030
DOIs
StatePublished - 2017
EventOptical Measurement Systems for Industrial Inspection X 2017 - Munich, Germany
Duration: 26 Jun 201729 Jun 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10329
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Measurement Systems for Industrial Inspection X 2017
Country/TerritoryGermany
CityMunich
Period26/06/1729/06/17

Keywords

  • diffraction
  • Displacement
  • phase modulation

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