Graphene reduction dynamics unveiled

Hung Chieh Tsai; Hung Wei Shiu; Min Chiang Chuang; Chia Hao Chen; Ching Yuan Su; Jonathon David White; Wei Yen Woon

doi:10.1088/2053-1583/2/3/031003

Graphene reduction dynamics unveiled

Hung Chieh Tsai, Hung Wei Shiu, Min Chiang Chuang, Chia Hao Chen, Ching Yuan Su, Jonathon David White, Wei Yen Woon

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The reduction dynamics of micron-sized defects created on chemical vapor deposition-(CVD) grown graphene through scanning probe lithography (SPL) is reported here. CVD-grown graphene was locally oxidized using SPL and subsequently reduced, making use of a focused beam of soft x-rays. During this whole process, the reduction dynamics was monitored using a combination of micro-Raman spectroscopy (μ-RS) and micro-x-ray photoelectron spectroscopy (μ-XPS). After x-ray reduction, the graphene film was found to be chemically identical (μ-XPS) but structurally different (μ-RS) from the original graphene. During reduction the population of C. Cbonds was found to first increase dramatically and then decrease exponentially. By modeling the dynamics of the C=O→C. O→C-C→C=C reduction process with four coupled-rate equations and three rate constants, the conversion from C-Cto C=C bonds was found to be the limiting rate.

Original language	English
Article number	31003
Journal	2D Materials
Volume	2
Issue number	3
DOIs	https://doi.org/10.1088/2053-1583/2/3/031003
State	Published - 6 Aug 2015

Keywords

Defects
Graphene
Photoelectron spectroscopy
Reduction
Scanning probe lithography

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10.1088/2053-1583/2/3/031003

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title = "Graphene reduction dynamics unveiled",

abstract = "The reduction dynamics of micron-sized defects created on chemical vapor deposition-(CVD) grown graphene through scanning probe lithography (SPL) is reported here. CVD-grown graphene was locally oxidized using SPL and subsequently reduced, making use of a focused beam of soft x-rays. During this whole process, the reduction dynamics was monitored using a combination of micro-Raman spectroscopy (μ-RS) and micro-x-ray photoelectron spectroscopy (μ-XPS). After x-ray reduction, the graphene film was found to be chemically identical (μ-XPS) but structurally different (μ-RS) from the original graphene. During reduction the population of C. Cbonds was found to first increase dramatically and then decrease exponentially. By modeling the dynamics of the C=O→C. O→C-C→C=C reduction process with four coupled-rate equations and three rate constants, the conversion from C-Cto C=C bonds was found to be the limiting rate.",

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AU - Tsai, Hung Chieh

AU - Shiu, Hung Wei

AU - Chuang, Min Chiang

AU - Chen, Chia Hao

AU - Su, Ching Yuan

AU - White, Jonathon David

AU - Woon, Wei Yen

PY - 2015/8/6

Y1 - 2015/8/6

N2 - The reduction dynamics of micron-sized defects created on chemical vapor deposition-(CVD) grown graphene through scanning probe lithography (SPL) is reported here. CVD-grown graphene was locally oxidized using SPL and subsequently reduced, making use of a focused beam of soft x-rays. During this whole process, the reduction dynamics was monitored using a combination of micro-Raman spectroscopy (μ-RS) and micro-x-ray photoelectron spectroscopy (μ-XPS). After x-ray reduction, the graphene film was found to be chemically identical (μ-XPS) but structurally different (μ-RS) from the original graphene. During reduction the population of C. Cbonds was found to first increase dramatically and then decrease exponentially. By modeling the dynamics of the C=O→C. O→C-C→C=C reduction process with four coupled-rate equations and three rate constants, the conversion from C-Cto C=C bonds was found to be the limiting rate.

AB - The reduction dynamics of micron-sized defects created on chemical vapor deposition-(CVD) grown graphene through scanning probe lithography (SPL) is reported here. CVD-grown graphene was locally oxidized using SPL and subsequently reduced, making use of a focused beam of soft x-rays. During this whole process, the reduction dynamics was monitored using a combination of micro-Raman spectroscopy (μ-RS) and micro-x-ray photoelectron spectroscopy (μ-XPS). After x-ray reduction, the graphene film was found to be chemically identical (μ-XPS) but structurally different (μ-RS) from the original graphene. During reduction the population of C. Cbonds was found to first increase dramatically and then decrease exponentially. By modeling the dynamics of the C=O→C. O→C-C→C=C reduction process with four coupled-rate equations and three rate constants, the conversion from C-Cto C=C bonds was found to be the limiting rate.

KW - Defects

KW - Graphene

KW - Photoelectron spectroscopy

KW - Reduction

KW - Scanning probe lithography

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DO - 10.1088/2053-1583/2/3/031003

M3 - 期刊論文

AN - SCOPUS:84953210785

SN - 2053-1583

VL - 2

JO - 2D Materials

JF - 2D Materials

IS - 3

M1 - 31003

ER -

Graphene reduction dynamics unveiled

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Keywords

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