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Gate leakage lowering and kink current suppression for antimonide-based field-effect transistors
H. K. Lin, Y. C. Lin, F. H. Huang, T. W. Fan, P. C. Chiu, J. I. Chyi, C. H. Ko, T. M. Kuan, M. K. Hsieh, W. C. Lee, C. H. Wann
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations