Gate leakage lowering and kink current suppression for antimonide-based field-effect transistors

H. K. Lin, Y. C. Lin, F. H. Huang, T. W. Fan, P. C. Chiu, J. I. Chyi, C. H. Ko, T. M. Kuan, M. K. Hsieh, W. C. Lee, C. H. Wann

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