Abstract
GaAs metal-semiconductor field-effect transistors (MESFETs) with extremely low resistance nonalloyed ohmic contacts have been demonstrated. The contact structure consists of an n+-InAs/GaAs strained-layer superlattice and an InAs cap layer. Contact resistances as low as 0.036 Ω mm have been measured. These results represent the smallest figures reported to date for GaAs field-effect transistors. Nonalloyed MESFETs with 1 μm gate lengths had transconductances of about 210 mS/mm.
Original language | English |
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Pages (from-to) | 775-776 |
Number of pages | 2 |
Journal | Applied Physics Letters |
Volume | 55 |
Issue number | 8 |
DOIs | |
State | Published - 1989 |