GaAs metal-semiconductor field-effect transistor with extremely low resistance nonalloyed ohmic contacts using an InAs/GaAs superlattice

N. S. Kumar, J. I. Chyi, C. K. Peng, H. Morkoç

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

GaAs metal-semiconductor field-effect transistors (MESFETs) with extremely low resistance nonalloyed ohmic contacts have been demonstrated. The contact structure consists of an n+-InAs/GaAs strained-layer superlattice and an InAs cap layer. Contact resistances as low as 0.036 Ω mm have been measured. These results represent the smallest figures reported to date for GaAs field-effect transistors. Nonalloyed MESFETs with 1 μm gate lengths had transconductances of about 210 mS/mm.

Original languageEnglish
Pages (from-to)775-776
Number of pages2
JournalApplied Physics Letters
Volume55
Issue number8
DOIs
StatePublished - 1989

Fingerprint

Dive into the research topics of 'GaAs metal-semiconductor field-effect transistor with extremely low resistance nonalloyed ohmic contacts using an InAs/GaAs superlattice'. Together they form a unique fingerprint.

Cite this