In this paper, the optimum functional patterns for CMOS operational amplifier are proposed based on an analysis to find the maximum difference between the good circuit and the faulty circuit for a CMOS operational amplifier. The theoretical and simulation results show that the derived test patterns do give the maximum difference at the output even when the circuit has a `soft' fault. The results have also been applied to generate test patterns for a programmable gain/loss mixed signal circuit.
|Number of pages||6|
|State||Published - 1997|
|Event||Proceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA|
Duration: 27 Apr 1997 → 1 May 1997
|Conference||Proceedings of the 1997 15th VLSI Test Symposium|
|City||Monterey, CA, USA|
|Period||27/04/97 → 1/05/97|