Functional test generation for finite state machines

Kwang Ting Cheng, Jing Yang Jou

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

37 Scopus citations


A functional test generation method for finite-state machines is described. A functional fault model, called the single-transition fault model, on the state transition level is used. In this model, a fault causes a single transition to a wrong destination state. A fault-collapsing technique for this fault model is also described. For each state transition, a small subset of states is selected as the faulty destination states so that the number of modeled faults for test generation is minimized. On the basis of this fault model, the authors developed an automatic test generation algorithm and built a test generation system. The effectiveness of this method is shown by experimental results on a set of benchmark finite-state machines. A 100% stuck-at fault coverage is achieved by the proposed method for several machines, and a very high coverage (>97%) is also obtained for other machines. In comparison with a gate-level test generator STG3, the test generation time is speeded up by a factor of 100.

Original languageEnglish
Title of host publicationDigest of Papers - International Test Conference
PublisherPubl by IEEE
Number of pages7
ISBN (Print)0818620641
StatePublished - Sep 1990
EventProceedings - International Test Conference 1990 - Washington, DC, USA
Duration: 10 Sep 199014 Sep 1990

Publication series

NameDigest of Papers - International Test Conference
ISSN (Print)0743-1686


ConferenceProceedings - International Test Conference 1990
CityWashington, DC, USA


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