Abstract
Photoetching of n-type silicon induces a photoluminescent (PL) layer containing nanocrystals on the irradiated surface, usually through band gap absorption (wavelength <1100 nm). Here, we demonstrate the formation of a PL layer restricted to the backside surface, not the irradiated surface, by using a 1064 nm Nd:YAG laser. A nanoscale structure of the PL layer is achieved by merely modifying the electrolyte concentration without adding oxidants. To illustrate the working principle, we submit the hypothesis of a quasi-pn structure based on the theory of a quasi-Fermi level. Because of the "injection current"effect due to the quasi-pn structure, the hole current promoted by free-carrier absorption flows toward the backside surface, leading to anodization. This result is remarkable because anodization of n-type silicon is very hard to achieve with just an etchant in the dark.
| Original language | English |
|---|---|
| Pages (from-to) | 26497-26503 |
| Number of pages | 7 |
| Journal | ACS Omega |
| Volume | 5 |
| Issue number | 41 |
| DOIs | |
| State | Published - 20 Oct 2020 |
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Dive into the research topics of 'Forming a photoluminescent layer on another surface in the dark through lasering of N-type silicon in an electrolyte'. Together they form a unique fingerprint.Projects
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Research on Charge-Accumulation Effect of Schottky Barrier on Electrochemistry to Develop the Technology of Anodizing N-Type Silicon in the Dark(2/2)
Lee, T.-H. (PI)
1/08/20 → 31/07/21
Project: Research
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