This paper presents a general form and a set of basic gates to implement (K+1)-valued PLA structure logic circuits. A complete fault analysis on the proposed circuit has been done and it is shown that all fanout stem fault collapsing is derived. For any function implemented in the (K+1)-valued circuit, the number of remaining faults is smaller than that of the 2-valued circuit after the collapsing, where the value of K is dependent on the number of outputs and the assignment of the OR plane of the 2-valued logic circuit.
|Number of pages||10|
|Journal||IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences|
|State||Published - Jun 1993|