Abstract
A new testing scheme, transient transition count (TTC) testing, which is able to detect hard-to-test faults and redundant faults, in addition to conventional stuck-at faults, is proposed. The scheme is based on applying a pair of transition patterns and observing the transition count of the transient output response of a circuit to detect faults. A fast and memory-efficient fault simulator which is based on PPSFP mechanism but can handle timing is implemented. Experimental results show that this scheme can reach a higher fault coverage than the conventional stuck-at fault testing.
| Original language | English |
|---|---|
| Pages (from-to) | 14-19 |
| Number of pages | 6 |
| Journal | Proceedings of the Asian Test Symposium |
| State | Published - 1994 |
| Event | Proceedings of the 3rd Asian Test Symposium - Nara, Jpn Duration: 15 Nov 1994 → 17 Nov 1994 |