Fast-write resistive RAM (RRAM) for embedded applications

Shyh Shyuan Sheu, Kuo Hsing Cheng, Meng Fan Chang, Pei Chia Chiang, Wen Pin Lin, Heng Yuan Lee, Pang Shiu Chen, Yu Sheng Chen, Tai Yuan Wu, Frederick T. Chen, Keng Li Su, Ming Jer Kao, Ming Jinn Tsai

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

Editor's note: Especially for microcontroller and mobile applications, embedded nonvolatile memory is an important technology offering to reduce power and provide local persistent storage. This article describes a new resistive RAM device with fast write operation to improve the speed of embedded nonvolatile memories.

Original languageEnglish
Article number5590231
Pages (from-to)64-71
Number of pages8
JournalIEEE Design and Test of Computers
Volume28
Issue number1
DOIs
StatePublished - Jan 2011

Keywords

  • design and test
  • fast access speed
  • multilevel
  • nonvolatile memory
  • resistive RAM
  • RRAM

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